Onyx - Graphene and 2D Materials Inspection

Onyx is the first system in the market designed to provide a full-area non-destructive characterization of Graphene, thin films, and other 2D materials. Onyx covers the gap between the macro and the nano scale tools characterizing from 0,5 mm2 to large areas (m2), enhancing the industrialization of the research materials. Compared to other large-area methods, such as the four-probe methods, Onyx is capable to measure the spatial distribution of the quality of the sample. Spatial resolution in the order of few hundreds of microns enable the fast characterization of large areas of sample as opposed to microscopic methods such as Raman, SEM, and TEM. In just one single measurement, the system is able to provide precisely the following physical properties: