Understanding the Resilience of Neural Network Ensembles against Faulty Training Data

Best Paper Award for Abraham Chan, Niranjhana Narayananan, Arpan Gujarati, Karthik Pattabiraman, and Sathish Gopalakrishnan, IEEE International Symposium on Quality, Reliability and Security (QRS2021). The topic examines Machine Learning model ensembles to aid in data accuracy for safety-critical systems, like autonomous vehicles and medical imaging.